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   Your location > Components > Microscopy

Instrumentation for Scanning Probe Microscopy (SPM)

As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.

In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation.  With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the  JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.

Focusing on high sample throughput and extreme stability even in sub-optimal environments, the Aarhus SPM Family offers scientists a wider range of SPM capabilities.

With the STM sensor remaining at room temperature, the sample temperature can be varied from cryogenic to elevated temperatures exceeding 1000C for all samples.

Furthermore, sample holders can be adapted to fit even the most sophisticated surface science methods.

Atomic force measurements on insulating surfaces are accomplished using the KolibriSensor with the SPM 150 Aarhus .  Based on a quartz oscillator, its unique versatility for non-contact AFM measurements allows scientists to discover non-conduction surfaces at atomic resolution on a daily basis.

In addition, the proven concept of Nanonis Control Systems allows scientists to explore all imaging and spectroscopic possibilities for their SPM research. 
 
 



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Joule-Thomson STM
Product Brochure
Catalogue for the JT-STM
 
Aarhus SPM Series
Product Brochure
The Aarhus SPM Series
 



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