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   Your location > Components

SPECS Components for Surface Analysis

SPECS manufactures cutting-edge systems and components for surface analysis in UHV, based on methods such as XPS, UPS, AES, ISS, STM, LEEM/PEEM, LEED, SIMS, SNMS and HREELS.

We offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators and research microscopes like LEEM and STM. A strong focus of our work is on customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options.

     

PHOIBOS

Scanning Probe Microscopy

Nanonis
 Electron Spectrometers  Scanning Probe Microscopy Nanonis
     

LEED

PCS-ECR
Ion Source IQE 12/38
Diffraction
Plasma Sources

 

   

X-Ray Sources

UV Sources

Electron Sources

X-Ray Sources
UV Sources Electron Sources
   
Electron Beam Evaporator
Software
 
Electron Beam Evaporator
Software
 
   
   
   

 

 

 


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