SPECS manufactures cutting-edge systems and components for surface analysis in UHV, based on methods such as XPS, UPS, AES, ISS, STM, LEEM/PEEM, LEED, SIMS, SNMS and HREELS.
We offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators and research microscopes like LEEM and STM. A strong focus of our work is on customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options.
|Electron Spectrometers||Scanning Probe Microscopy||Sources|
|LEEM/PEEM||LEED||Thin Film Growth|