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   Your location > Software > SpecsLab > SpecsLab Prodigy > Advanced Automation

Advanced Automation

Additional Commands for More Advanced Automation

Sputter Depth Profiling

Sputter operations with an ion gun are performed between measurements. When the ion gun is coupled with a valve control unit (VCU 1000) the pressure can be regulated as well.

SDP
 

Sputter Cleaning

The Sputter command allows specifying sputter cycles without a measurement to clean the specimen before the actual acquisition or to perform sputter-anneal cycles in combination with a remote controlled heater.
 
Sputter
 

Auto Flood Gun Adjustment

The flood gun settings for optimum charge compensation prior to the actual acquisition can be automatically set up with this command.

AutoFG
 

Auto Sample Height Adjustment

In combination with a remote controlled manipulator and a monochromatized or focused x-ray source the distance between the Phoibos analyzer entrance and the sample surface can be automatically adjusted to compensate for different sample thicknesses.

AutoZ
 

Profiling

The Profiling command performs measurements while changing parameters linearly between start and end values with a number of steps. An arbitrary number of orthogonal dimensions can be specified and for each dimension linear dependent parameters can be added. This command can be used to perform acquisitions at different temperatures, with different gas mixtures or at certain positions on a sample (along a line or on a grid). The parameters which are adjusted between the individual cycles can originate from different devices.
Data from acquisitions like this can be plotted per cycle and displayed in the Plot View or Image View.

Profiling
 

Step Profiling

The Step Profiling command is similar to the Profiling command but the values for each parameter in each cycle can be explicitly specified. Those values can be imported and exported to Microsoft Excel and text files.
 
StepProfiling
 

Ramping

The Ramping command interpolates parameters of the device between start and end values with a given rate and sets them in intervals to perform a parameter ramping. This is performed independently of the acquisition progress and in parallel to it.

This can be used, for example, to continuously heat a sample while performing acquisitions along the way. While measuring the spectrum the actual temperature per measurement point can be recorded to produce an additional data curve besides the actual spectrum.

Ramping
 

Further Integration

The versatile ARMIN 10 device can act as a bridge between SpecsLab Prodigy and other external devices. Via analog input, analog output, digital input, or digital outputs it can integrate them into an automated experiment. It can generate Transistor–Transistor Logic (TTL) signals during experiment executions, wait for special conditions, read analog voltages and currents and scale them to logical units to perform customized automated experiments.



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