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 News 2014

2014-10-31 - Special end-of-year sale November 2014
End-of-year comes close. Take advantage of our monthly sales opportunities.

 
2014-10-06 - Guided Company Tour and Live Demonstration of FE-LEEM P90 AC
The LEEM/PEEM-9 conference took place in Berlin from September 14 to 18, 2014, bringing together more than 150 scientists from all over the globe.
 
2014-10-01 - Special end-of-year sale October 2014
End-of-year comes close. Take advantage of our monthly sales opportunities.
 
2014-09-01 - Special end-of-year sale September 2014
End-of-year comes close. Take advantage of our monthly sales opportunities.
 
2014-07-30 - Guided Company Tour and LEEM/PEEM live demonstration at SPECS
SPECS headquarters is located in the center of Berlin. This gives us the opportunity to offer a supplementary company visit including a live LEEM/PEEM demonstration.
 
2014-07-01 - New CEO at SPECS Surface Nano Analysis GmbH
Dr. Ferdinand Bartels will assume the position of CEO of SPECS Surface Nano Analysis GmbH  from July 1, 2014
 
2014-06-04 - ASXMT 2014 Poster Award sponsored by SPECS
The 5th International Workshop on Advanced Scanning Probe Microscopy Techniques (ASXMT) was held in Karlsruhe (Germany) from February 24 to 25 at the Karlsruhe Institute of Technology (KIT).
 
2014-05-13 - Gaede-Award 2014
Dr. Yuriy S. Dedkov, currently employed by SPECS Surface Nano Analysis GmbH, has been awarded the Gaede award 2014 at this year’s spring conference of the German Physical Society (DPG). 

2014-11-10 - Special end-of-year sale
Special end-of-year sale 
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2014-07-10 - New CEO at SPECS Surface Nano Analysis GmbH
Dr. Ferdinand Bartels will assume the position of CEO of SPECS Surface Nano Analysis GmbH from July 1, 2014 
more
2014-10-06 - Guided Company Tour and Live Demonstration of FE-LEEM P90 AC on September 18, 2014
SPECS headquarters is located in the center of Berlin. This gives us the opportunity to ... 
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2014-05-13 - Gaede-Award 2014
Structure and characteristics of graphene on metal surfaces  
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2014-06-04 - ASXMT 2014 Poster Award sponsored by SPECS
5th International Workshop on Advanced Scanning Probe Microscopy Techniques 2014 
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