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   Your location > Applications & Results > Scientific Conference Contributions

Scientific Conference Contributions

SPECS and the regional SPECS Sales Partners are participating in many conferences and workshops each year. SPECS also contributes to the scientific sessions with oral or poster presentations. In this section you can find selected scientific posters presented by SPECS in the last two years.
 
KREIOS    
KREIOS
   
Instrumentation for and applications of momentum spectroscopy / microscopy
 KREIOS 150: Next Generation ARPES Instrument for Advanced Materials Research(landscape)
  KREIOS 150: Next Generation ARPES Instrument for Advanced Materials Research (portrait)    KREIOS & METIS: Instrumentation for and applications of momentum spectroscopy/microscopy
 
KREIOS METIS
   

Spin-resolved time-of-flight momentum microscopy

   

METIS 1000 and KREIOS 150
  METIS: Spin-resolved time-of-flight momentum microscopy
  THEMIS: Angular resolved time-of-flight spectroscopy

       
 THEMIS: Detection of Electron Pair Emission Using Time-of-Flight Spectrometers
       

 EnviroESCA landscape format  
EnviroESCA panel format
 
EnviroESCA: The Revolution of a Method (landscape)   EnviroESCA: The Revolution of a Method (portrait)
  EnviroESCA: Surface characterisation of bacteria and biofilms by NAP-XPS

   
SPIN CCD
   
 SPIN: Imaging Spin Detector for Electron Spectroscopy
   SPIN CCD: Modeling of magnetic Lenses for Spin Polarization Manipulation
   

AAFMT

  SPP Graphene   

AAFMT: Imaging contrast of graphene moiré on metals   Multichannel scanning probe microscopy and spectroscopy of graphene structures
  Crystallogrpahic and electronic structure of graphene on the pseudomorphic Cu/Ir(111) substrate

 

 

Surface Analysis under Near Ambient Pressure Conditions

Low Energy Electron Microscopy
  Near Concepts in Near Ambient Pressure XPS - Sample Environment, Excitation Sources, System Concepts
  Surface Analysis under Near Ambient Pressure Conditions
Scientific Poster LEEM-SPM
  LEEM-PEEM-P90-NAP   NAP-LEEM
Application of LEEM/PEEM and STM/ncAFM to Graphene on Metal Surfaces
  Low Energy Electron Microscopy at Near Ambient Pressures
  Low Energy and Photo Electron Emmission Microscopy at Near Ambient Pressures
        
The PHOIBOS Anaylzer Series: Electron Spectrometers for Hard X-ray Photoemission Spectroscopy
 
 

 

 

 


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