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   Your location > Near Ambient Pressure Analysis > Instrumentation for NAP Microscopy and Structural Studies

Instrumentation for Near Ambient Pressure (NAP) Microscopy and Structural Studies

Scanning Probe Microscopy (SPM) and Low Energy Electron Microscopy (LEEM) are powerful tools for spectroscopic and imaging investigations on nanometer length scales. SPECS offers dedicated solutions for SPM and LEEM studies under NAP conditions.
     

SPM Aarhus NAP
LEEM/PEEM NAP
NAP RHEED
 



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