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   Your location > Components > Diffraction > ErLEED > Safire

SAFIRE

Diffraction Image Acquisition and Processing System
for LEED and RHEED

  • Windows 98 to Windows XP operating system supported
  • high sensitivity analog (video) camera support with multiple entry 10 bit frame grabber board (standard)
  • 12 bit digital camera support with peak quantum efficiency up to 62% (optional)
with TCP/IP ARM interface (ARMIN) for primary energy control (0-10V output), e-beam current readout (amplified 0-10V input) and additional parameter (0-10V input), potential isolated
 

Specifications


  • switchable between RHEED and LEED mode
  • variable exposure time n x 40ms (analog), 1 - 10 000 ms (digital)
  • practically unlimited number and shapes of sensors (straight, elliptical and freeform lines; rectangular, circular, elliptical and freeform areas)
  • point (integrated intensity), line profile and plane (movie-like 2D intensity distribution) scan of sensor vs. energy, time and free defined parameter X (e.g. temperature T) for I(V), I(t) and I(T) measurements for LEED
  • point (integrated intensity), line profile and plane (movie-like 2D intensity distribution) scan of sensor vs. time for RHEED
  • video recording with 1:1 recording of live image to hard disk
  • pre-trigger with live arbitrary length buffer of measurement
  • trigger with other measurements, sensor intensity or external signal possible
  • time stamp with exact date and time recorded with each measurement
  • repeat scan with synchronous repetitions of measurement stored in same data set
  • R factor analysis (Pendry and R2) for LEED
  • peak spacing for separation of reflections (lattice constant)
  • peak width for FWHM of reflections (island size)
  • averaging by integration in memory up to 16 bit dynamic range
  • Kikuchi line analysis with fitting of pattern for RHEED: misorientation, crystal potential
  • radar scan with horizontal 2D cuts through reciprocal space
  • slice - plane and line scans; horizontal (space/time) and vertical
  • integrate - plane and line scans; horizontal (space/time) and vertical
  • Fourier transform - plane and line scans; horizontal (space/time) and vertical
  • sine fit of point scans; amplitude, period, phase, damping
  • running sine fit for point scans; analyzes variable period
  • multitasking: measurements can run in parallel, independent of each other
  • export formats: ascii, tiff and pgm
 


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