|The 2nd International Workshop on Advanced Atomic Force Microscopy Techniques (AAFMT) was held in Karlsruhe (Germany) from February 28th to 1st of March at the Karlsruhe Institute of Technology (KIT). As stated in the abstract book “The workshop has again been a forum for stimulating discussions and the exchange of new ideas which will help to explore the nanoworld in more detail”.|
SPECS Surface Nano Analysis GmbH sponsored the Poster Award for the best young scientists elected within the workshop by an independent judging committee. The three winners where:
1st prize: Dr. Remy Pawlak (University of Basel), “Low temperature STM/ncAFM studies of adsorbed organic molecules: High resolution imaging and manipulation”
2nd prize: Daniel Platz (KTH, Stockholm), „Reconstructing conservative and non-conservative interactions with intermodulation atomic force microscopy”
3rd prize: Philip Egberts (INM, Saarbrücken), “Torwads the ultimate resolution of nanoindentation: Measurement of homogeneous dislocation nucleation in three dimensions”
From left to right:
The awarding ceremony took place at the Institute of Nanotechnology (INT) within the campus north of the KIT on 1st of March 2011.