The University of Dayton will be hosting a CasaXPS Software Training Course 7-8 March 2011, and a set of short courses on AES and XPS/ESCA including Data Processing, 11-15 April 2011. The hands-on CasaXPS course is new, and the surface analysis courses have been re-designed to include data processing procedures (not details of how to operate software) rather than having a separate data processing course. This was in response to suggestions from students who attended last year. Perhaps you or a colleague might be interested in attending these courses at the University.
The CasaXPS course will include an overview of the features in CasaXPS, converting data in different file formats (such as from Kratos, Physical Electronics, and Thermo Fisher Scientific [formerly VG]) into the ISO standard format, different display modes, different peak identification and labeling methods, different background subtraction methods (linear, Shirley, Tougaard,…), peak areas, sensitivity factors and their linked databases, quantitative analysis using default transitions and user-selected transitions, adding peaks, curve fitting, selection of lineshapes and backgrounds, curve fitting using reference spectra, combining curve fit data into quantitative analysis tables, correcting energy scale for sample charging, propagating processed data to other data, depth profile data, least squares fitting, annotation relative to peaks or to the display box, spectrum zoom, inserting additional spectra within a window, copying spectra into reports, changing aspect ratios, changing fonts, changing line colors, batch processing, customizing CasaXPS, creating and saving versions with special databases, use in data processing with other techniques such as AES and SIMS. Attendees are required to bring their own laptop and will be provided with a demonstration copy of CasaXPS version 2.3.15 to keep, data to process, “An Introduction to XPS and AES” by Neal Fairley (pdf format), as well as a 400 page printed user manual for version 2.3.15.
The five-day set of short courses on the two major electron spectroscopy techniques, Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS/ESCA) is designed for scientists, engineers, technicians, and students, who would like a detailed understanding of the uses of AES, XPS/ESCA, and Data Processing for surface analysis and depth profiling. These courses can be taken as a 5-day package or they can be taken individually. A comprehensive set of notes on AES and/or XPS/ESCA will be provided for each course participant. You may also order an optional copy of the 900 page book “Surface Analysis by Auger and X-ray Photoelectron Spectroscopy”, edited by D. Briggs and J.T. Grant, 2003.
Detailed information on the CasaXPS Software Training Course
Printable registration form