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   Your location > News > News Archiv 2009

New Product - SPM 150 Aarhus

To extend the proven concept of the STM 150 Aarhus to image insulating surfaces on the atomic scale, SPECS applies a quartz oscillating length extension resonator (LER) for ultimate non-contact atomic force microscopy (NC-AFM) performance. (more )

 
AFM  AFM



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