2009-08-25 - New FE-LEEM P90 results
New Results: 2.0 nm lateral resolution with aberration corrected FE-LEEM P90
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News Archiv 2009
2009-08-25 - New FE-LEEM P90 results
New Results: 2.0 nm lateral resolution with aberration corrected FE-LEEM P90 more
2009-01-29 - Nanonis Control System
Strongest emphasis on usability, stability and flexibility in SPM control system more |
News Archive
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