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SPECS leads the way in state-of-the-art technology, cutting-edge components, compact and individually designed systems for surface analysis. SPECS Surface Nano Analysis GmbH headquarters are situated in the center of Germany’s capital Berlin with the subsidiaries SPECS Zurich GmbH , based in Zurich, Switzerland, SPECS Surface Nano Analysis Inc. in Mansfield, MA, USA and Beijing SPECS Surface Nano Analysis GmbH Technology Co. Ltd. in Beijing, China.

SPECS’ scientists and engineers are embedded in a global team of more than 150 employees designing, producing, selling and maintaining instruments for surface science, material science and nanotechnology. SPECS offers more than 30 years of experience in state-of-the-art instrumentation for your research.  


 SPECS News
 
 SPECS Service & Support
  SPECS Service & Support will be present for the first time at AVS 2018.
Come along and discuss with us your questions about spare parts, repairs, service contracts.
 

 
   1er curso teórico/práctico de XPS  

1er curso teórico/práctico de XPS

> watch video here 
 

 
  Gas Cluster Ion Beam (GCIB) sputtering with EnviroESCA
  Gas Cluster Ion Beam (GCIB) sputtering with EnviroESCA

This application note presents how the optional GCIB source at the EnviroESCA can be used to clean samples prior to XPS analysis to get reproducible analytical data and reliable quantification results. Moreover, Argon cluster Arn+ (n= 500-5000) sputtering and depth profiling of (bio)organic samples is possible which cannot be done when...

> More information

 

 



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   Conferences
 
7th International Symposium on Transparent Conductive Materials (TCM2018)
14.10. - 19.10.2018
Crete, Greece 
Korean Symposium of Surface Analysis (KOSSA)
17.10. - 19.10.2018
Seoul, Korea
Seventeenth Topical Conference on Quantitative Surface Analysis (QSA 17)     21.10.2018
Long Beach, CA, USA 
AVS 65th
21.10. - 26.10.2018
California, USA
Applied Nanotechnology and Nanoscience International Conference (ANNIC 2018)
22.10. - 24.10.2018
Berlin, Germany 
11th LEEM/PEEM Workshop
30.10. - 03.11.2018
Chongqing, China 

   Publications
 
Apparatus for dosing liquid water in ultrahigh vacuum 
> Publication

 
Growth and Intercalation of Graphene on Silicon Carbide Studied by Low‐Energy Electron Microscopy > Publication
 
In-Situ Photoelectron Spectroscopy (p. 264-279)
> Publication
 
Spin- and Angle-Resolved Photoemission Study of the Alq3/Co Interface > Publication
 
Detection of suspended nanoparticles with near-ambient pressure x-ray photoelectron spectroscopy > Publication
 


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