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   Your location > Home

Welcome to SPECS

Your Partner for Customized Systems and Components for Surface Science

SPECS Spectroscopy SPECS Microscopy Development Clean Room


SPECS leads the way in state-of-the-art technology, cutting-edge components and individually designed complex systems for surface analysis.

SPECS GmbH headquarters are situated in the center of Germany’s capital Berlin with a subsidiary, SPECS Zurich GmbH, based in Zurich, Switzerland. SPECS forms a team of scientists and engineers with more than 150 employees engaged in the design and production of instruments for nanotechnology, material science and surface science in general.

For now over 25 years, know-how, experience, intensive contact to scientists from all over the world, customer orientation and reliable quality control have been the keys to SPECS success.


 

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Most Cited Ultramicroscopy Articles

The paper A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
Ultramicroscopy, 110, Issue 7, June 2010, Pages 852-861 is listed among the most cited Ultramicroscopy papers since 2009.

       
 
   New CEO   New CEO at SPECS Surface Nano Analysis GmbH
Berlin, July 1st, 2014


Dr. Ferdinand Bartels will assume the position of CEO of SPECS Surface Nano Analysis GmbH  from July 1, 2014.
Dr. Ferdinand Bartels began his career in the field of microtechnology and semiconductor technology.
After receiving a doctorate ... (read more)
       

 

 

 



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DPG Frühjahrstagung
15.03. - 20.03.2015
Berlin, Germany
SPM Sondes Locales
16.03. - 20.03.2015
Troyes, France 
ISSC-20
30.03. - 02.04.2015
Birmingham, UK
HAXPES 2015
30.03. - 03.04.2015
Hsinchu, Taiwan
MRS Spring    
06.04. - 10.04.2015
San Francisco, CA, USA
XIX COngreso Argentino de Fisicoquímica y Química Inorgánica
12.04. - 15.04.2015
Argentina, Buenos Aires
 
(more)
 
Direct observation of spin-resolved full and empty electron states in ferromagnetic surface > Publication

Transit excitons at metal surfaces > Publication

Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of electro-
chemical passivation oxide layers on Al–Cr–Fe complex metallic alloys (CMAs) > Publication

Electron pair emission detected by time-of-flight spectrometers: Recent progress > Publication

Electronic structure and imaging contrast of graphene moiré on metals > Publication

Preparation and investigation of the A-site and B-site terminated SrTiO3(001) surface > Pulication

Graphene on Rh(111): Scanning tunneling and atomic force microscopies studies > Publication

Flipping Behavior of a Porphyrin Derivative Molecule on a Au(111) Reconstructed Surface > Publication

(more)


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