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   Your location > Home

Welcome to SPECS

Your Partner for Customized Systems and Components for Surface Science

SPECS Spectroscopy SPECS Microscopy Development Clean Room


SPECS leads the way in state-of-the-art technology, cutting-edge components and individually designed complex systems for surface analysis.

SPECS GmbH headquarters are situated in the center of Germany’s capital Berlin with a subsidiary, SPECS Zurich GmbH, based in Zurich, Switzerland. SPECS forms a team of scientists and engineers with more than 150 employees engaged in the design and production of instruments for nanotechnology, material science and surface science in general.

For now over 25 years, know-how, experience, intensive contact to scientists from all over the world, customer orientation and reliable quality control have been the keys to SPECS success.


 

 News


 
   Jaap Kautz standing behind his apparatus.  

NeVac prize to University of Leiden

Jaap Kautz and Johannes Jobst have won the NeVac prize for developing a completely new method for studying electrical conductivity. The article they and their team leader Sense Jan van der Molen wrote about this subject was praised by the jury for its clarity. The prize has been presented to them on NeVac-day, 17 April 2015, in Groningen. The results have been taken using the aberration corrected FE-LEEM P90 AC. SPECS congratulates Jaap and Johannes for their success.

 
 
     

Most Cited Ultramicroscopy Articles

The paper A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
Ultramicroscopy, 110, Issue 7, June 2010, Pages 852-861 is listed among the most cited Ultramicroscopy papers since 2009.

       
 
   New CEO   New CEO at SPECS Surface Nano Analysis GmbH
Berlin, July 1st, 2014


Dr. Ferdinand Bartels will assume the position of CEO of SPECS Surface Nano Analysis GmbH  from July 1, 2014.
Dr. Ferdinand Bartels began his career in the field of microtechnology and semiconductor technology.
After receiving a doctorate ... (read more)
       

 

 

 



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ICMAT 2015
28.06. - 03.07.2015
Singapore, Singapore
MMC 2015
29.06. - 02.07.2015
Manchester, UK 
IBWAP 2015
02.07. - 04.07.2015
Constanta, Romania 
CORPES 15
05.07. - 10.07.2015
Paris, France 
20th International Conference on Magnetism
05.07. - 10.07.2015
Barcelona, Spain
SRI2015
06.07. - 10.07.2015          
New York, NY, USA 
 
(more)
 
Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments > Publication

Direct observation of spin-resolved full and empty electron states in ferromagnetic surface > Publication

Transit excitons at metal surfaces > Publication

Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of electro-
chemical passivation oxide layers on Al–Cr–Fe complex metallic alloys (CMAs) > Publication

Electron pair emission detected by time-of-flight spectrometers: Recent progress > Publication

Electronic structure and imaging contrast of graphene moiré on metals > Publication

Preparation and investigation of the A-site and B-site terminated SrTiO3(001) surface > Pulication

(more)


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