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   Your location > Components > Spectroscopy > Hemispherical Spectrometers > PHOIBOS 100/150 > Application Notes PHOIBOS

PHOIBOS 100/150 Application Notes

Lens Modes
a  Lens Modes.pdf
The multi-element transfer lens of the PHOIBOS analyzer may be operated in several new modes for angular and spatially resolved studies. A summary of the characteristics of these modes.
 
a  Large Area Lens Mode.pdf
Most suitable mode for laterally resolved large area studies. Deliberately designed for the large spot size of a non-monochromated X-ray source (acceptance - emittance matching). High angular acceptance from a large area.
 
a  Magnification Modes.pdf
 
These modes are particularly suitable for spatially resolved studies.  
 
a  Transmission Modes.pdf
The high transmission modes are most suitable for lateral resolved studies with highest (7 mm) slit width or for experiments with limited acceptance area due to the spot size of the source.
 
a  UPS Modes.pdf
For low kinetic energy applications some modes are available which accelerate the electrons in the first part of the lens to minimize disturbance by stray magnetic fields.
 
 
Quantification  
a  Overlayer.pdf
Thickness determination of mulitlayered systems.

 
Acceptance Area

a  Defined area XPS Performance.pdf
XPS performance of the PHOIBOS 100 MCD-5 analyzer on a Ag/Cu edge with a broad illuminating X-ray source (Mg Ka, 300W). Acceptance area determined by moving the sample perpendicular to the surface normal.
 
a  Defined Area XPS_with_IrisAperture.pdf
Iris aperture at the front of the PHOIBOS lens eliminates photoelectrons emitted by the sample holder.

 
Options
a  Deflector-stigmator.pdf
Laterally adjustable acceptance area by optional deflector stigmator to be incorparated into the lens.
 
a  TNotes-SlabImaging.pdf
XPS imaging is a powerful analytical tool because it enables specific information on both elements and bonding to be recorded on a two-dimensional distribution map.
 
a  TNotes-XPS Mapping using Deflectors.pdf
In this document an XPS mapping XPS technique which uses the optional lens deflectors of the PHOIBOS analyzer series is explained.
 

 

 

 


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