pix Illustration pix
pix pix Home
pix
pix
pix bull Components
pix
pix
pix pix Spectroscopy
pix
pix pix Microscopy
pix
pix pix Nanonis
pix
pix pix Diffraction
pix
pix pix Plasma Sources
pix
pix bill Ion Sources
pix
pix pix IQE 12/38
pix
pix pix IQE 11/35
pix
pix pix IQP 10/63
pix
pix bull Wien Mass Filter
pix
pix pix X-Ray Sources
pix
pix pix UV Sources
pix
pix pix Electron Sources
pix
pix pix Electron Beam Evaporator
pix
pix pix Systems
pix
pix
pix pix Software
pix
pix
pix pix Applications & Results
pix
pix
pix pix News
pix
pix
pix pix Downloads & Tools
pix
pix
pix pix Company Profile & Careers
pix
pix
pix pix Contact & Support
pix
pix
pix

   Your location > Components > Ion Sources > Wien Mass Filter

Wien Mass Filter

Wien Mass Filter

 
Features:

  • High Transmission
  • Resolution m/Δm > 20@5 keV
  • Additional port for differential pumping
  • Stigmatic correction and beam adjustment
  • Bakeable up do 350° C
  • Beam blanking
  • Retrofitable to IQE 12/38 ion source  
 
Applications:

The Wien Mass Filter WF-IQE is used for SIMS and SNMS depth profiling analysis in combination with an ion source for producing a pure ion beam, free from neutral particles. In surface and thin film analysis systems it may be used as a primary ion source for
  • Dynamic SIMS and SNMS analysis, meeting most exacting requirements
  • Ion Scattering Spectroscopy (ISS)

Product Description:

For accurate depth profiling analysis the ion beam of an electron impact or plasma ion source must be of high purity and free from neutral particles. This is ensured by the Wien Mass Filter which eliminates ions of unwanted isotopes and impurities as well as multiply charged ions and neutral particles.




pix

Wien Mass Filter product brochure

Wien
For more information contact us


pix
pix
© SPECS GmbH all rights reserved
    PRINT PAGE
  Sitemap   Terms   Legal Details 
pix
pix