SPECS is present at all important scientific conferences worldwide in the field of UHV Surface Analysis throughout the year. Please stop by at our booths and learn about the latest surface analysis systems and components available at SPECS. If the booth number is not announced yet, contact us for more information. | ||||
| October | November | December | ||
| ALS User Meeting 2012 08.10. - 10.10.2012 Berkeley, USA | LEEM/PEEM 11.11. - 15.11.2012 Hong Kong, China | IPS Conference 2012 Israel Physical Society 09.12.2012 Jerusalem, Israel | ||
| SLONANO 24.10. - 26.10.2012 Ljubljana, Slovenia | MRS Fall 2012 25.11. - 30.11.2012 Boston, USA | SSSFEL12 10.12. - 11.12.2012 Trieste, Italia | ||
AVS 59 | Soft X-ray Spectroscopy Satellite Workshop | Fourth Joint BER II and BESSY II Users' Meeting 13.12. - 14.12.2012 Berlin, Germany | ||
| Rusnanotech 2012 31.10. - 02.11.2012 Moscow, Russia | 7th Workshop on Applications of Scanning Probe Microscopy STM/AFM 2012 28.11. - 02.12.2012 Zakopane, Poland | 7th Singapore International Chemistry Conference SICC 16.12. - 19.12.2012 Singapore, Singapore | ||
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Conferences 2012
For more information contact us