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   Your location > Applications & Results > SPM Image Gallery > NC-AFM

2.06 – NC-AFM

Subsurface Atoms of Si(111)(7x7)

Si(111)
 
Si(111)
   
Instrument: SPM 150 Aarhus with KolibriSensor
Imaging parameters: Constant detuning NC-AFM image
Δf = -1.4 Hz, fres = 999,105 Hz, Q= 32,600, A = 300 pm
Image size: 18nm x 18nm, 10 nm x 10 nm
Temperature: room temperature
   

Image taken at SPECS Laboratory

A special tip termination occasionally obtained by gentle tip crashes allows to image all rest atoms and back-bond atoms on the Si(111)(7x7) surface, rather than adatoms.

 
Compact SPM System



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Image Gallery
   2.01 – NC-AFM
Atomic Resolution on Ag(111)
     
Graphene-AFM-Z   2.02 – NC-AFM
Atomic Resolution on Graphene
     
Graphene-AFM-3_kl   2.03 – NC-AFM
Graphene on Ru(0001)
     
C-Ru0001-KPFM-U1   2.04 – Kelvin Probe Microscopy
Contact Potential Map of Graphene/Ru(0001)
     
Atomic Steps on Si(111)(7x7)   2.05 – NC-AFM
Atomic Steps on Si(111)(7x7)
     
   2.06 – NC-AFM
Subsurface Atoms of Si(111)(7x7)
     
Atomic Resolution on Si(111)(7x7)   2.07 – NC-AFM
Atomic Resolution on Si(111)(7x7)
     
Atomic Resolution on KBr(001)  

2.08 – NC-AFM
Atomic Resolution on KBr(001)

     
Water layer on KBr(001)  

2.09 – NC-AFM
Water layer on KBr(001)

     
Atomic Resolution on Au(111)   2.10 – NC-AFM
Atomic Resolution on Au(111)
     
Atomic Resolution on Cobaltite   2.11 – NC-AFM
Atomic Resolution on Cobaltite
     
Surface potential imaging on CaF2(111)   2.12 - Kelvin Probe Microscopy
Surface potential imaging on CaF2(111)
     
   2.13 - High Temperature NC-AFM
Graphene/Ru(0001) at 650 K


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