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   Your location > Components > Microscopy > Curlew

Curlew™ SPM

In Situ SPM

Combining Scanning Probe Microscopy and Scanning Electron/Ion Microscopy

Curlew

Curlew Logo

Product Description

 

The combination of Scanning Probe Microscopy (SPM) and Scanning Electron/Auger Microscopy (SEM/SAM/FIB) is the perfect complement of imaging speed and resolution from millimeter field of views down to the atomic scale. The Curlew in situ SPM provides the possibility of the analysis, probing, and manipulation of the same sample feature by SPM and SEM/SAM/FIB techniques without the need for time-consuming feature back-tracing. In addition it adds sub-nanometer surface sensitivity resolution and the ability to image insulating surfaces to SEM and FIB systems. The many electron-/ion-matter interaction signals providing spectroscopic and crystallographic surface information can be superimposed with SPM topography data. The Curlew in situ SPM gives new
perspectives with respect to surface analysis, probing and manipulation at the nanometer scale.
 
The Curlew SPM features a stiff sensor design based on a ceramic base plate with conductive paths for tip/sensor contacting. Manipulation of tips and sensors is easy and safe. The Curlew SPM accepts different kinds of electrical sensors including tunneling tips, Akiyama-Probes (Nanosensors™) as well as quartz-based sensors. All sensors have a protruding tip that allows for direct SEM vision-controlled tip/sensor positioning and control.

 

 

 


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Curlew Product Brochure
Curlew brochure


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