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   Your location > Applications & Results > SPM Image Gallery > NC-AFM

2.12 – Kelvin Probe Microscopy

Surface potential imaging on CaF2(111)

z
UCPD
Colorbar-Z1CaF2_KPM_z
CaF2_KPM_U1Colorbar Bias U1

    
Colorbar z2CaF2_KPM_z2 CaF2_KPM_U2Colorbar Bias U2
   
Instrument: SPM 150 Aarhus with KolibriSensor
Imaging parameters: Frequency Modulation Kelvin Probe Force Microscopy
Δf = -0.3 Hz, fres = 998,901 Hz, A = 2 nm, Q= 23800, UAC, mod = 0.6 V, fmod = 65 Hz
Image size: 700 nm x 700 nm, 500 nm x 500 nm
Temperature: room temperature
   
Image taken at SPECS Laboratory
 
The insulating CaF2(111) surface was prepared in-situ by cleavage. Variations on terraces as well as a strong contrast at step edges can be observed in the surface potential map UCPD.
 
Compact SPM System



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Image Gallery
   2.01 – NC-AFM
Atomic Resolution on Ag(111)
     
Graphene-AFM-Z   2.02 – NC-AFM
Atomic Resolution on Graphene
     
Graphene-AFM-3_kl   2.03 – NC-AFM
Graphene on Ru(0001)
     
C-Ru0001-KPFM-U1   2.04 – Kelvin Probe Microscopy
Contact Potential Map of Graphene/Ru(0001)
     
Atomic Steps on Si(111)(7x7)   2.05 – NC-AFM
Atomic Steps on Si(111)(7x7)
     
   2.06 – NC-AFM
Subsurface Atoms of Si(111)(7x7)
     
Atomic Resolution on Si(111)(7x7)   2.07 – NC-AFM
Atomic Resolution on Si(111)(7x7)
     
Atomic Resolution on KBr(001)  

2.08 – NC-AFM
Atomic Resolution on KBr(001)

     
Water layer on KBr(001)  

2.09 – NC-AFM
Water layer on KBr(001)

     
Atomic Resolution on Au(111)   2.10 – NC-AFM
Atomic Resolution on Au(111)
     
Atomic Resolution on Cobaltite   2.11 – NC-AFM
Atomic Resolution on Cobaltite
     
Surface potential imaging on CaF2(111)   2.12 - Kelvin Probe Microscopy
Surface potential imaging on CaF2(111)
     
   2.13 - High Temperature NC-AFM
Graphene/Ru(0001) at 650 K


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