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   Your location > Applications & Results > SPM Image Gallery > NC-AFM

2.04 – Kelvin Probe Microscopy

Contact Potential Map of Graphene/Ru(0001)

z
UCPD
Colorbar-Z1C Ru(0001) KPFM Z1
C Ru(0001) KPFM U1Colorbar Bias 1

    
Colorbar zC Ru(0001) KPFM Z2 C Ru(0001) KPFM U2Colorbar Bias
   
Instrument: SPM 150 Aarhus with KolibriSensor
Imaging parameters: Frequency Modulation Kelvin Probe Force Microscopy
Δf = -0.24 Hz, fres = 999,154 Hz, A = 500 pm, Q= 29600, UAC, mod = 0.5 V, fmod = 75 Hz
Image size: 300 nm x 300 nm, 100 nm x 100 nm
Temperature: room temperature
   
Image taken at SPECS Laboratory
 
The graphene was grown by chemical vapor deposition of ethylene on Ru(0001). At low coverages the growth of monolayers and isolated islands was observed. The contact potential map UCPD reveals the regions on the substrate which are covered by a graphene layer. Bright regions in UCPD correspond to the metal substrate, dark regions to the graphene monolayer.
 
Compact SPM System



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Image Gallery
   2.01 – NC-AFM
Atomic Resolution on Ag(111)
     
Graphene-AFM-Z   2.02 – NC-AFM
Atomic Resolution on Graphene
     
Graphene-AFM-3_kl   2.03 – NC-AFM
Graphene on Ru(0001)
     
C-Ru0001-KPFM-U1   2.04 – Kelvin Probe Microscopy
Contact Potential Map of Graphene/Ru(0001)
     
Atomic Steps on Si(111)(7x7)   2.05 – NC-AFM
Atomic Steps on Si(111)(7x7)
     
   2.06 – NC-AFM
Subsurface Atoms of Si(111)(7x7)
     
Atomic Resolution on Si(111)(7x7)   2.07 – NC-AFM
Atomic Resolution on Si(111)(7x7)
     
Atomic Resolution on KBr(001)  

2.08 – NC-AFM
Atomic Resolution on KBr(001)

     
Water layer on KBr(001)  

2.09 – NC-AFM
Water layer on KBr(001)

     
Atomic Resolution on Au(111)   2.10 – NC-AFM
Atomic Resolution on Au(111)
     
Atomic Resolution on Cobaltite   2.11 – NC-AFM
Atomic Resolution on Cobaltite
     
Surface potential imaging on CaF2(111)   2.12 - Kelvin Probe Microscopy
Surface potential imaging on CaF2(111)
     
   2.13 - High Temperature NC-AFM
Graphene/Ru(0001) at 650 K


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