While topographical AFM image is usually acquired with the first resonance frequency of the cantilever, much additional information such as electrical and mechanical properties of the material can be acquired simultaneously by taking advantage of multiple frequencies.
With the new Nanonis Oscillation Controller it is now easier than ever to extend normal AFM operation to multiple frequencies. Both the OC4-Station and the Nanonis SPM Control System can easily be upgraded to Dual OC4. The modularity of such a system allows the user to operate each OC4 as either a Lock-in amplifier or a Phase Lock Loop (PLL), independently or in a synchronous manner. A wealth of new dynamic AFM modes become available with many new SPM applications to explore.