pix Illustration pix
pix pix Home
pix
pix
pix bull Components
pix
pix
pix pix Spectroscopy
pix
pix pix Microscopy
pix
pix bill Nanonis
pix
pix pix Control System
pix
pix bull Oscillation Controller
pix
pix pix OC4.5-Station
pix
pix bull Dual-OC4
pix
pix pix Kelvin Probe Controller
pix
pix pix Tramea System
pix
pix pix Diffraction
pix
pix pix Plasma Sources
pix
pix pix Ion Sources
pix
pix pix X-Ray Sources
pix
pix pix UV Sources
pix
pix pix Electron Sources
pix
pix pix Electron Beam Evaporator
pix
pix pix Systems
pix
pix
pix pix Software
pix
pix
pix pix Applications & Results
pix
pix
pix pix News
pix
pix
pix pix Downloads & Tools
pix
pix
pix pix Company Profile & Careers
pix
pix
pix pix Contact & Support
pix
pix
pix

   Your location > Components > Nanonis > Oscillation Controller > Dual-OC4

Dual-OC4 for multi-frequency AFM

Extend the functionality of your SPM to multiple frequencies.

Dual-OC4
 

While topographical AFM image is usually acquired with the first resonance frequency of the cantilever, much additional information such as electrical and mechanical properties of the material can be acquired simultaneously by taking advantage of multiple frequencies.

With the new Nanonis Oscillation Controller it is now easier than ever to extend normal AFM operation to multiple frequencies. Both the OC4-Station and the Nanonis SPM Control System can easily be upgraded to Dual OC4. The modularity of such a system allows the user to operate each OC4 as either a Lock-in amplifier or a Phase Lock Loop (PLL), independently or in a synchronous manner. A wealth of new dynamic AFM modes become available with many new SPM applications to explore.

More...

For more information about the Nanonis Control Systems, please visit www.specs-zurich.com.



pix
The Nanonis Oscillation Controller Product Brochure
The Nanonis Oscillation Controller  
   


pix
pix
© SPECS GmbH all rights reserved
    PRINT PAGE
  Sitemap   Terms   Legal Details 
pix
pix