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| Instrument: | SPM 150 Aarhus with KolibriSensor™ | |
| Imaging parameters: | Constant detuning NC-AFM image Δf = -0.5 Hz, fres = 999,107 Hz, Q= 26500, A = 500 pm | |
| Image size: | 5 nm x 5 nm | |
| Temperature: | room temperature | |
| Image taken at SPECS Laboratory | ||
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2.05 – NC-AFM
Atomic Steps on Si(111)(7x7)
Image Gallery
 | 2.01 – NC-AFM Atomic Resolution on Ag(111) | |
 | 2.02 – NC-AFM Atomic Resolution on Graphene | |
 | 2.03 – NC-AFM Graphene on Ru(0001) | |
 | 2.04 – Kelvin Probe Microscopy Contact Potential Map of Graphene/Ru(0001) | |
 | 2.05 – NC-AFM Atomic Steps on Si(111)(7x7) | |
 | 2.06 – NC-AFM Subsurface Atoms of Si(111)(7x7) | |
 | 2.07 – NC-AFM Atomic Resolution on Si(111)(7x7) | |
 | 2.08 – NC-AFM | |
 | 2.09 – NC-AFM | |
 | 2.10 – NC-AFM Atomic Resolution on Au(111) | |
 | 2.11 – NC-AFM Atomic Resolution on Cobaltite | |
 | 2.12 - Kelvin Probe Microscopy Surface potential imaging on CaF2(111) | |
 | 2.13 - High Temperature NC-AFM Graphene/Ru(0001) at 650 K |