Features:
| |  Zoom |
Product Description:
To extend the proven concept of the STM Aarhus 150 to image insulating surfaces on the atomic scale, SPECS applies the quartz KolibriSensor™ for ultimate non-contact atomic force microscopy (NC-AFM) performance.
In combination with a Nanonis control system with state-of-the-art low noise frequency demodulation the SPM Aarhus 150 opens scientists the atomic view on all surfaces. With the sensor tip being contacted separately, force and tunneling current signals can be recorded independently and simultaneously.
With ‘in-situ’ sensor preparation, the Aarhus SPM makes atomic resolution imaging achievable on a daily basis.
| Applications: | | |
| Large scale topographic AFM image of the insulating KBr(001) surface recorded in constant detuning feedback (Δf) mode (image size 250 nm x 250 nm). Oscillation amplitude A=400 pm, resonance frequency fres=997,387 kHz, Δf =-2.1 Hz. | | |
| Atomic resolution topographic AFM image of the insulating KBr(001) surface recorded in constant detuning feedback (Δf) mode. Oscillation amplitude A=100 pm, resonance frequency fres=999,110 Hz, Δf =0.24 Hz. | ||
| Topographic AFM image of the Si(111)-(7x7) surface recorded in constant detuning feedback (Δf) mode. Oscillation amplitude A=300 pm, | ||
| Force spectroscopy: Δf versus z-displacement recorded on the Si(111)(7x7) surface. The tunneling current is recorded simultaneously. |
| Multi-Mode STM/AFM measurement on Si(111)(7x7). Imaging parameters: fres=999,110 Hz, A=500 pm, It =0.3 nA, U=0.95 V and mean detuning f=-1.0 Hz. |
