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   Your location > Components > Spectroscopy > Hemispherical Spectrometers > PHOIBOS 225

PHOIBOS 225 Application Notes

UPS
 TNotes FermiEdge at low temperature (PHOIBOS 225)
 Proof of the sub-meV energy resolution capability of the PHOIBOS 225 HiRes with He I photoemission from the Fermi Edge of a Ag sample at low temperature.
  
 TNote Energy Resolution Test PHOIBOS 225
 Energy resolution test of the PHOIBOS 225.
  
HAXPES
 Exchange Bias Bilayer System NiO/CoPt
 The study of magnetic materials with engineered structural features at the nanoscale and tailored magnetic properties is an open and research field... (more )
  
 HAXPES on the beamline P09 at PETRA III
 For revealing properties of bulk and interface structures, Hard X-ray Photoelectron Spectroscopy (HAXPES) is expected to be used increasingly in the near future... (more )
  
 Dynamic Range of 3D-DLD Delayline Detector
 The HAXPES chamber at the P09 photoelectron spectroscopy beamline from PETRA III is equipped with a SPECS PHOIBOS 225 HV hemispherical analyzer... (more )
  
 PHOIBOS 225 HV Fermi Edge Results at High Energies
 The Fermi-edge of a polycrystalline Au sample was measured at low temperature (30K) and high kinetic energy (about 8 keV)...(more )
  
 Grazing Incidence Geometry
 For revealing properties of bulk and interface structures, Hard X-ray Photoelectron Spectroscopy (HAXPES) is expected to be used increasingly in the near future... (more )
  
 HAXPES on the beamline ID32 at the ESRF
 The HAXPES chamber at the ID 32 beamline from the ESRF is equipped with a  hemispherical analyzer from SPECS... (more )
  
 PHOIBOS 225 HV used for Rutherford Electron Backscattering at 15 keV
 The elastic scattering of keV electrons can be used to determine the surface composition of relatively thick layers (up to 100 nm) in a way similar to ion scattering experiments... (more )
  



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