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   Your location > News > News Archiv 2007

First FE-LEEM P90 Commissioned

2007/05/25

SPECS has successfully commissioned the first FE-LEEM P90 with energy filter. The instrument has been thoroughly tested by our development team together with Dr. Rudolf Tromp. The microscope completely performs according to the specifications.

e-loss                leed
Energy loss spectrum   LEED pattern of Si(100)

 

 

   
 LEEM    PEEM
LEEM image of Si(100)   PEEM image of patterned sample


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Get more information on the SPECS FE-LEEM P90 here



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