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   Your location > Applications & Results > Publications by Products > INA-X

List of publications

Secondary Neutral Mass Spectrometry (SNMS) System INA-X

(This list only contains publications which have been notified to SPECS GmbH by customers. It is not a complete list of all publications on reserach conducted with the INAX-System) 

 
2007

7. G. L. Katona, Z. Berenyi,  L. Peter,  K. Vad, "Depth profile analysisof electrodeposited nanoscale multilayers by SNMS", Vacuum 82, 270-273

6. A. Csik, G. A. Langer, G. Erdélyi, D. L. Beke, Z. Erdelyi, K. Vad, "Investigation of Sb diffusion in amorphous  silicon", Vacuum 82, 257-260

5. Lazlo Peter, Gabor L. Katona, Zoltan Berenyi, Kalman Vad, Gabor A. Langer, Eniko Toth-Kadar, Jozsef Padar, Lajos Pogany, Imre Bakonyi, "Electrodeposition of Ni-Co-Cu/Cu multilayers 2. Calculation of the element distribution and experimental depth profila analysis", Electrochimica Acta 53, 837-845 

2005

4. A. Csik, G. Erdélyi, G.A. Langer, L. Daróczi, D.L. Beke, J. Nyéki, Z. Erdélyi, "Pattern formation in SiSb system", Vacuum 80, 168-173, (2005)


2004

3. J. Jorzick, J. Lösch, M. Kopnarski, H. Oechsner, "Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X", Applied Physics A. 78, pp. 655-658 (2004)


2000

2. Hans Oechsner, Wolfgang Bock, Michael Kopnarski, Mathias Müller, "INA-X: An Advanced Instrument for Electron-Gas SNMS", Mikrochimica Acta 133, 69-73 (2000)


1999

1. Hans Oechsner, Matthias Müller, "INA-X: A novel instrument for electron-gas secondary neutral mass spectrometry with optional in situ x-ray photoelectron spectroscopy, J. Vac. Sci. Technol. A 17(6), Nov/Dec (1999)

(This list only contains publications which have been notified to SPECS GmbH by customers. It is not a complete list of all publications on reserach conducted with the INAX-System) 


2005

5. A. Csik, G. Erdélyi, G.A. Langer, L. Daróczi, D.L. Beke, J. Nyéki, Z. Erdélyi, "Pattern formation in SiSb system", Vacuum 80, 168-173, (2005)


2004
4. J. Jorzick, J. Lösch, M. Kopnarski, H. Oechsner, "Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X", Applied Physics A. 78, pp. 655-658 (2004)


2000
3. Hans Oechsner, Wolfgang Bock, Michael Kopnarski, Mathias Müller, "INA-X: An Advanced Instrument for Electron-Gas SNMS", Mikrochimica Acta 133, 69-73 (2000)


1999
2. Hans Oechsner, Matthias Müller, "INA-X: A novel instrument for electron-gas secondary neutral mass spectrometry with optional in situ x-ray photoelectron spectroscopy, J. Vac. Sci. Technol. A 17(6), Nov/Dec (1999)

1. A. Csik, G. Erdélyi, L. Daróczi, D. L. Deke, J. Nyéki, Z. Erdélyi "Pattern formation in SiSb", submitted to Vacuum



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