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   Your location > Components > Diffraction

ErLEED

Reverse View LEED Optics

Low Energy Electron Diffraction (LEED) is one of the most powerful methods to determine surface structures. Analysis of LEED patterns and intensities provides the size and shape of the surface unit cell, the degree of order, and detailed atomic structure with a precision of the order of picometers. To exploit the full power of the technique, equally capable instrumentation is required. SPECS LEED systems together with highly sophisticated acquisition and analysis solutions provide the experimenter with many unique advantages present in no other commercial unit. 
 

RHEED

Reflection High Energy Electron Diffraction

Reflection High Energy Electron Diffraction (RHEED) is a powerful method for the structural analysis of surfaces.

Capable of being operated over a wide range of pressures RHEED is the method of choice in a variety of applications regarding thin film growth, surface coating and material deposition techniques. RHEED thereby allows to determine the surface structure at any time before, during, and after the growth process, as well as to monitor the growth process itself. SPECS RHEED components combine stability and longevity together with reliable performance. Sophisticated acquisition and analysis solutions complete our product portfolio.

Generally, the structural information given by a RHEED pattern results from the position and the intensity of the diffraction spots as well as from the spot profiles. In particular, the surface unit cell of the reciprocal lattice and the corresponding real space unit cell follow from the positions of the RHEED spots. From the spot profiles the quality and degree of long range order at the surface can be deduced, providing important statistical information of the surface, such as the average lattice parameters.

 


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