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   Your location > Systems > Stand-alone Systems > INA-X (SNMS/SIMS)

INA-X List of Publications


(This list only contains publications which have been provided to SPECS GmbH by its customers. It is not a complete list of all publications on reserach conducted with the INA-X System) 

 

2010

19. "Secondary Neutral Mass Spectrometry with Plasma Post-Ionization"
H. Oechsner
Encycl. Mass Spectrometry Vol.5, D.Beauchemin and D.E. Matthews (Eds.), Elsevier 2010, pp 455-469

18. "On the composition depth profile of electrodeposited Fe-Co-Ni alloys".
L. Péter, A. Csik, K. Vad, E. Tóth-Kádár, Á. Pekker, and G. Molnár. 
Electrochimica Acta 55 (2010) 4734-4741.

17. "Investigations of diffusion kinetics in Si/Ta/Cu/W and Si/Co/Ta systems by secondary neutral mass spectrometry".
A. Lakatos, G. Erdelyi, G.A. Langer, L. Daroczi, K. Vad, A. Csik, A. Dudas, and D.L. Beke.
Vacuum 84 (2010) 953–957

16. "Investigations of failure mechanisms at Ta and TaO diffusion barriers by Secondary Neutral Mass Spectrometry",
A. Lakatos, A. Csik, G.A. Langer, G. Erdelyi, G.L. Katona, L. Daroczi, K. Vad, J. Toth, and D.L. Beke. 
Vacuum
84(1) 130-133
(2010)

15.  "Application of Secondary Neutral Mass Spectrometry in the investigation of doped perovskites",
K. Vad, J. Hakl, A. Csik, S. Meszaros, M. Kis-Varga, G.A. Langer, A. Pallinger, and M. Bodog. 
Vacuum 84(1) 144-146 (2010)

14.  "Analysis of Co/Cu multilayers by SNMS reverse depth profiling",
A. Csik, K. Vad, G.A. Langer, G.L. Katona, E. Toth-Kadar, and L. Peter. 
Vacuum 84(1) 141-143 (2010)

 

2009

13.  "Metastability of two-dimensional vortex glass in Bi2Sr2CaCu2O8+δ",
K. Pallinger, B. Sas, G. Kriza, K. Vad, L. Forro, H. Berger, F. Portier, and F.I.B. Williams. 
Physical Review B 80, 024206 (2009)

12. "Secondary neutral mass spectroscopy - a powerful technique for quantitative elemental and depth profiling analyses of nanostructures",
K. Vad, A. Csik, and G.A. Langer. 
Spectroscopy Europe, 21(4),  13-16 (2009)

11.  "Application of Surface Roughness Data for the Evaluation of Depth Profile Measurements of Nanoscale Multilayers",
A. Bartók, A. Csik, K. Vad, G. Molnár, E. Tóth-Kádár, and L. Péter.
Journal of The Electrochemical Society, 156(7) D253-D260 (2009)

10.  "Spontaneous near-substrate composition modulation in electrodeposited Fe-Co-Ni alloys",
A. Csik, K. Vad, E. Tóth-Kádár, L. Péter.
Electrochemistry Communications 11, 1289–1291

9. "Quantitative characterization of solid state phases by secondary neutral mass spectrometry",
H. Oechsner, R. Getto, and M. Kopnarski. 
Journal of Applied Physics 105, 063523 (2009)

8.  "Operation and application of a new time-of-flight e-gas secondary neutral mass spectrometer (ToF-SNMS)",
M. Kopnarski, J. Lösch, and L. Simeonov. 
Anal Bioanal Chem, 393: 1913-1916 (2009)


2008

7. "Depth profile analysis of electrodeposited nanoscale multilayers by SNMS",
G. L. Katona, Z. Berenyi,  L. Peter,  K. Vad,
Vacuum 82, 270-273

6. "Investigation of Sb diffusion in amorphous  silicon",
A. Csik, G. A. Langer, G. Erdélyi, D. L. Beke, Z. Erdelyi, K. Vad,
Vacuum 82, 257-260

 

2007

5. "Electrodeposition of Ni-Co-Cu/Cu multilayers 2. Calculation of the element distribution and experimental depth profila analysis",
Lazlo Peter, Gabor L. Katona, Zoltan Berenyi, Kalman Vad, Gabor A. Langer, Eniko Toth-Kadar, Jozsef Padar, Lajos Pogany, Imre Bakonyi,
Electrochimica Acta 53, 837-845 

2005

4. "Pattern formation in SiSb system",
A. Csik, G. Erdélyi, G.A. Langer, L. Daróczi, D.L. Beke, J. Nyéki, Z. Erdélyi,
Vacuum 80, 168-173, (2005)


2004

3. "Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X",
J. Jorzick, J. Lösch, M. Kopnarski, H. Oechsner,
Applied Physics A. 78, pp. 655-658 (2004)


2000

2. "INA-X: An Advanced Instrument for Electron-Gas SNMS",
Hans Oechsner, Wolfgang Bock, Michael Kopnarski, Mathias Müller,
Mikrochimica Acta 133, 69-73 (2000)


1999

1. "INA-X: A novel instrument for electron-gas secondary neutral mass spectrometry with optional in situ x-ray photoelectron spectroscopy",
Hans Oechsner, Matthias Müller,
J. Vac. Sci. Technol. A 17(6), Nov/Dec (1999)

 

 

 


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